Time-of-Flight studies on TiO2 – CuInS2 heterojunctions Joris Hofhuis, Joop Schoonman, Albert Goossens Opto-Electronic Materials, Faculty of Applied Sciences, Delft University of Technology, Julianalaan 136, 2628 BL De - Bias tee - Document - PDFSEARCH.IO

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	Time-of-Flight studies on TiO2 – CuInS2 heterojunctions Joris Hofhuis, Joop Schoonman, Albert Goossens Opto-Electronic Materials, Faculty of Applied Sciences, Delft University of Technology, Julianalaan 136, 2628 BL De Add to Reading List Document Date: 2010-05-11 12:44:19 Open Document File Size: 190,25 KB Share Result on Facebook / Facility Delft University of Technology / / IndustryTerm charge carrier mobility / / OperatingSystem Fermi / / Organization Delft University of Technology / Faculty of Applied Sciences / / Person Albert Goossens / / Technology laser / / SocialTag Bias tee Biasing Mass spectrometry Spectroscopy Time of flight

Time-of-Flight studies on TiO2 – CuInS2 heterojunctions Joris Hofhuis, Joop Schoonman, Albert Goossens Opto-Electronic Materials, Faculty of Applied Sciences, Delft University of Technology, Julianalaan 136, 2628 BL DeAdd to Reading List