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SURFACE AND INTERFACE ANALYSIS Surf. Interface Anal. 2005; 37: 895–900 Published online in Wiley InterScience (www.interscience.wiley.com). DOI: sia.2107 A new examination of secondary electron yield data Yingh
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Document Date: 2009-06-24 12:40:33
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File Size: 159,02 KB
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