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Electronics / Boundary scan / Joint Test Action Group / Automatic test pattern generation / Berkeley Software Distribution / NetApp / Netlist / Boundary scan description language / Electronics manufacturing / Electronic engineering / Manufacturing


onTAP Test Types Application Note Testing for the IEEEand IEEEJTAG / Boundary Scan Standard onTAP ATPG - Test-to-Print onTAP’s ATPG reads CAD netlists and BSDL files to generate test programs that veri
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Document Date: 2015-03-12 12:56:49


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