<--- Back to Details
First PageDocument Content
Pseudorandom number generators / Cryptography / Binary arithmetic / Linear feedback shift register / Knapsack problem / Theoretical computer science / Applied mathematics / Mathematics
Date: 2011-02-14 15:21:20
Pseudorandom number generators
Cryptography
Binary arithmetic
Linear feedback shift register
Knapsack problem
Theoretical computer science
Applied mathematics
Mathematics

Cryptanalysis of the Knapsack Generator

Add to Reading List

Source URL: www.iacr.org

Download Document from Source Website

File Size: 73,47 KB

Share Document on Facebook

Similar Documents

Binary arithmetic / Finite fields / Computing / Mathematics / Data transmission / Error detection and correction / Cryptography / Cyclic redundancy checks / Linear-feedback shift register / Parity bit / Cksum / Polynomial code

ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Peer Reviewed Open Access International Journal

DocID: 1qvWR - View Document

Cryptography / Pseudorandom number generators / Stream ciphers / Feedback with Carry Shift Registers / Shrinking generator / Self-shrinking generator / Linear-feedback shift register / P-adic number / VEST

Microsoft Word - IBSS&K Engineering.doc

DocID: 1qpK0 - View Document

Pseudorandom number generators / Cryptography / Theoretical computer science / Applied mathematics / Random number generation / Mersenne Twister / Pseudorandomness / Algorithm / Data Encryption Standard / Linear-feedback shift register / Reconfigurable computing / TestU01

Design & Implementation of Well-Method for Embedded Generation of LPR Numbers Venkateshwarlu Purumala M.Tech, VLSI & Embedded Systems DVR College of Engineering and Technology,

DocID: 1q4Bj - View Document

Electronic design automation / Asset Health Management / Built-in self-test / Test equipment / Electronic design / Linear-feedback shift register / Digital electronics / Test vector

ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Peer Reviewed Open Access International Journal

DocID: 1pvKr - View Document

Integrated circuits / Automatic test pattern generation / Linear-feedback shift register / Built-in self-test / Scan chain / Hardware Trojan

Low Power MSIC Signatures for Effective BIST Design Chekka Narasimha Rao M.Tech Student, Audi Sankara Institute of Technology, NH-5 Bypass Road, East Gudur Rural, Andrapradesh

DocID: 1oOsm - View Document