Argonne National Laboratory

Results: 880



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1Parallel tracking-based optimization of dynamic aperture and lifetime V. Sajaev, M. Borland Argonne National Laboratory November 2010

Parallel tracking-based optimization of dynamic aperture and lifetime V. Sajaev, M. Borland Argonne National Laboratory November 2010

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Source URL: media4.physics.indiana.edu

Language: English - Date: 2010-11-12 07:11:43
    2Computational Grids Ian Foster Mathematics and Computer Science Division Argonne National Laboratory Argonne, ILCarl Kesselman

    Computational Grids Ian Foster Mathematics and Computer Science Division Argonne National Laboratory Argonne, ILCarl Kesselman

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    Source URL: grid.desy.de

    Language: English - Date: 2005-05-30 06:04:05
      3ARGONNE NATIONAL LABORATORY RELEVANT EXPERIENCE AND PUBLICATIONS RELATED TO TECHNOLOGICALLY ENHANCED NATURALLY OCCURRING RADIOACTIVE MATERIAL RISK ASSESSMENT RELEVANT EXPERIENCE Scientists at the U.S. Department of Energ

      ARGONNE NATIONAL LABORATORY RELEVANT EXPERIENCE AND PUBLICATIONS RELATED TO TECHNOLOGICALLY ENHANCED NATURALLY OCCURRING RADIOACTIVE MATERIAL RISK ASSESSMENT RELEVANT EXPERIENCE Scientists at the U.S. Department of Energ

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      Source URL: deq.nd.gov

      Language: English - Date: 2014-12-05 06:07:00
        4Matthew	Tirrell		 Founding	Pritzker	Director	and	Dean	 Deputy	Laboratory	Director	for	Science,	Argonne	National	Laboratory

        Matthew Tirrell Founding Pritzker Director and Dean Deputy Laboratory Director for Science, Argonne National Laboratory

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        Source URL: d3qi0qp55mx5f5.cloudfront.net

        Language: English - Date: 2017-01-09 14:31:51
          5Argonne National Laboratory Scanning Confocal Electron Microscope (SCEM): Nanoscale Quality Control in Semiconductor Manufacturing and R&D In today’s technologically driven society, many important electronic/photonic d

          Argonne National Laboratory Scanning Confocal Electron Microscope (SCEM): Nanoscale Quality Control in Semiconductor Manufacturing and R&D In today’s technologically driven society, many important electronic/photonic d

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          Source URL: www.amc.anl.gov

          Language: English - Date: 2005-07-25 16:04:26
            6Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens Nestor J. Zaluzec, Jon Hiller Electron Microscopy Center, Argonne National Laboratory, Argonne, IL, USAThe Scanning Confocal Electron Microscope has bee

            Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens Nestor J. Zaluzec, Jon Hiller Electron Microscopy Center, Argonne National Laboratory, Argonne, IL, USAThe Scanning Confocal Electron Microscope has bee

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            Source URL: www.amc.anl.gov

            Language: English - Date: 2005-02-12 22:03:00
              7Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens Nestor J. Zaluzec, Jon Hiller Electron Microscopy Center, Argonne National Laboratory, Argonne, IL, USAThe Scanning Confocal Electron Microscope has bee

              Comparison of SCEM and STEM-HAADF Imaging in Thick Specimens Nestor J. Zaluzec, Jon Hiller Electron Microscopy Center, Argonne National Laboratory, Argonne, IL, USAThe Scanning Confocal Electron Microscope has bee

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              Source URL: 146.139.72.10

              Language: English - Date: 2005-02-12 22:03:00
                8Campus‐wide Resilience Assessment Frédéric Petit, Rosalie Laramore, David Dickinson, and Julia Phillips Risk and Infrastructure Science Center Global Security Sciences Division, Argonne National Laboratory Presented

                Campus‐wide Resilience Assessment Frédéric Petit, Rosalie Laramore, David Dickinson, and Julia Phillips Risk and Infrastructure Science Center Global Security Sciences Division, Argonne National Laboratory Presented

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                Source URL: www.gss.anl.gov

                Language: English - Date: 2015-09-01 09:51:28
                  9Modeling Circularly-Polarizing ID Effects at APS  L. Emery and A. Xiao Accelerator Systems Division Argonne National Laboratory Mini-workshop on Dynamic Aperture Issues of USR

                  Modeling Circularly-Polarizing ID Effects at APS L. Emery and A. Xiao Accelerator Systems Division Argonne National Laboratory Mini-workshop on Dynamic Aperture Issues of USR

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                  Source URL: media4.physics.indiana.edu

                  Language: English - Date: 2010-11-11 06:42:22
                    10A Roadmap for Nuclear Energy Technology Dr. Tanju Sofu  Argonne National Laboratory

                    A Roadmap for Nuclear Energy Technology Dr. Tanju Sofu Argonne National Laboratory

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                    Source URL: www.fnal.gov

                    Language: English - Date: 2017-06-22 10:26:01