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Electronics / Noise temperature / Johnson–Nyquist noise / Phonon noise / Amplifier / Thermal conductivity / Resistor / Anthony E. Siegman / Noise figure / Noise / Electromagnetism / Electrical engineering


APPLIED PHYSICS LETTERS VOLUME 72, NUMBER[removed]MARCH 1998
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Document Date: 1999-12-02 12:46:36


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Pasadena / New Haven / /

Company

D. E. Prober / Jet Propulsion Laboratory / /

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pence / USD / /

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Facility

American Institute of Physics / American Institute of Physics Burke et al. / Yale University / /

IndustryTerm

e-beam / to this device / given device / /

Organization

National Aeronautics and Space Administration / American Institute of Physics / NASA office of Space Science / National Science Foundation / Yale University / B. S. Karasik / M. C. Gaidis / W. R. McGrath / B. Bumble / and H. G. LeDuc Center for Space Microelectronics Technology / American Institute of Physics Burke / /

Person

P. J. Burke / /

Position

representative / /

ProvinceOrState

California / Connecticut / /

Technology

Microwave / lithography / broadband / /

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