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Electronic engineering / Integrated circuit / Random-access memory / Laser / EPROM / Reading / Dynamic random-access memory / CMOS / 1T-SRAM / Computer memory / Computer hardware / Electronics


Optical Fault Induction Attacks Sergei P. Skorobogatov and Ross J. Anderson University of Cambridge, Computer Laboratory,
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Document Date: 2004-03-15 14:46:06

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File Size: 504,40 KB

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City

Cambridge / /

Company

Computer Laboratory / /

Country

United Kingdom / /

Currency

USD / /

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Event

Product Issues / /

Facility

Ross J. Anderson University of Cambridge / port In / /

IndustryTerm

eV photon energy / possible using low-cost equipment / consumer electronics / memory technologies / laser equipment / metal / automated probing equipment / laser device / photon energy / silicon devices / target chip / semiconductor devices / lab equipment / secure microcontroller chips / metal shielding / defensive technology / less energy / individual chip / semiconductor chip / security processors / metal surface / chip testing equipment / security devices / energy / /

Organization

Anderson University / /

Person

Sergei P. Skorobogatov / B.S. Kaliski Jr. / /

Product

TTLlevel / signature Sp / computation / /

Technology

semiconductor / target chip / radiation / laser / memory technologies / semiconductors / X-ray / lasers / naked chip / semiconductor chip / semiconductor devices / individual chip / block cipher / security processors / secure microcontroller chips / SRAM / digital signature / integrated circuits / Flash / bus encryption / defensive technology / /

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